Source: Proceedings. Conference titles: International Conference on Metamaterials, Photonic Crystals and Plasmonics - META 2019. Unidade: EESC
Subjects: ÓPTICA, LENTES, SENSORES ÓPTICOS, INFRAVERMELHO
ABNT
MARTINS, Augusto et al. Incidence angle-dependence in image reconstruction crosstalk of broadband birefringent c-Si metasurfaces. 2019, Anais.. Lisbon: Escola de Engenharia de São Carlos, Universidade de São Paulo, 2019. . Acesso em: 01 maio 2024.APA
Martins, A., Li, J., Mota, A. F., Wang, Y., Goncalves Neto, L., Borges, B. -H. V., & Martins, E. R. (2019). Incidence angle-dependence in image reconstruction crosstalk of broadband birefringent c-Si metasurfaces. In Proceedings. Lisbon: Escola de Engenharia de São Carlos, Universidade de São Paulo.NLM
Martins A, Li J, Mota AF, Wang Y, Goncalves Neto L, Borges B-HV, Martins ER. Incidence angle-dependence in image reconstruction crosstalk of broadband birefringent c-Si metasurfaces. Proceedings. 2019 ;[citado 2024 maio 01 ]Vancouver
Martins A, Li J, Mota AF, Wang Y, Goncalves Neto L, Borges B-HV, Martins ER. Incidence angle-dependence in image reconstruction crosstalk of broadband birefringent c-Si metasurfaces. Proceedings. 2019 ;[citado 2024 maio 01 ]